Metrology

As with great laser power comes great responsibility for coaters, OPTOMAN doesn’t call optical components high quality by default. Measurements and inspections are needed to define the quality. OPTOMAN is equipped to do it.

OPTOMAN is carefully inspecting the quality of the optics produced, so the customer can enjoy seamless usage of optical components, without investing his time and effort to ensure that optics are compliant with the specifications.

OPTOMAN metrology equipment

Used for transmittance and reflectance measurements for all polarisation modes.

Measuring range: 185 mm – 4900 nm
Measuring AOI: from 0 – 75°
Smallest step size: 0.25 nm

Scanning Spectrophotometer – Photon RT

Used for fully automated surface quality inspection according to ISO 10110-7 standard

Capabilities:

Nominal resolution: 2.5 µm
Smallest visible defects: 1 µm
Finest specification: 5/1×0.016; L1x0.01
Complex CA: round, elliptical, rectangular, polygon
Multiple CA
Inspection of spherical surfaces
Component size up to 205 mm × 205 mm × 50 mm

Measurements of flatness, irregularity and Transmitted wavefront distortion (WFD)

Capabilities:

Low Coherence

Wavelength: 633 nm

Flatness: λ/20 (PV – Peak to Valley)

<0.2 nm (RMS)

Clear aperture: round, elliptical, rectangular.

Interferometer: Optoflat

Phase characteristics of mirrors and transparent optical components

Spectral range: 650 – 1700nm

Polarization modes: s, p, unpolarized.

Single mirror Configuration: 0°, ≤10°, 45°

Mirror pair configuration: ≤10°, 45°

Outsourcing Machinery and Measurements

OPTOMAN has a network of trusted allies who expand the metrology capabilities
 and enhance it with their expertise in the field.

Measurements done at the Vilnius University Center for Physical Sciences and Technology (VU FTMC)

Wavelengths for measurements: 1064 nm, 532 nm, 355 nm, 266 nm.
AOI: 0, 45°
Polarisation modes: s, p.

Cavity Ring Down (CRD) measurements

Measurements done at the Vilnius University Center for Physical Sciences and Technology (VU FTMC)

Used to measure and localise mechanical properties.

Capabilities

Measured area: from 1×1 µm up to 20×20 µm

Atomic force microscopy

Measurements done at Lidaris

Capabilities

1-on-1 test ISO 1-on-1 LIDT test (21254-1,2) – Lidaris
S-on-1 test ISO S-on-1 LIDT test (21254-1,2) – Lidaris
R-on-1 test R-on-1 LIDT test – Lidaris
LIDT Certification test ISO LIDT Certification Test (21254-1,3) – Lidaris

Laser-Induced Damage Threshold (LIDT) measurements

Measurements done at Lidaris

Capabilities

Lifetime:“Classical” Lifetime Test (ps, fs @ kHz) – Lidaris

Optics lifetime measurements

Measurements done at Lidaris

Capabilities

Absorption: PCI absorptance testing of dielectric coatings – Lidaris

Absorption measurements

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